Data: 2013-02-27 09:25:34 | |
Autor: Jacek Politowski | |
S.M.A.R.T. - Toshiba - Reported_Uncorrect | |
Mam serię laptopów z dyskami Toshiby MK3256GSY. W podobnym czasie
większość (wszystkie?) dysków zaczyna się "kończyć", przy czym większość ma realokowane sektory i raw_value 191 (G-Sense_Error_Rate) na poziomie >3000 (value/worst/threshold 100/100/000). Jeden nie ;), ma natomiast inne błędy, których do końca zinterpretować nie potrafię. Przede wszystkim atrybut 187 (Reported_Uncorrect) jest niebezpiecznie blisko progu (001/000), gdy pozostałe dyski mają 100/000. (zastanawiam się też czy ma szansę kiedykolwiek ten próg osiągnąć) Podejrzewam też, że błędy widoczne w error logu (Error: UNC ...") są właśnie z tym "uncorrect" związane. Ale co to za błędy? Kolejną dziwną rzeczą jest temperatura. Wczoraj raw_value było 22/24, później max nieco się podniósł w trakcie pracy. Dziś już minimum ma 41 stopni. Tak jakby jakoś resetował licznik po wyłączeniu komputera. Długie testy S.M.A.R.T. wszystkie dyski przechodzą, atrybuty (realokowane sektory i inne błędy) po teście nie zmieniają się. A, pozostałe dyski (z realokowanymi sektorami) mają raw_value 183 (Runtime_Bad_Block) = 1, ten opisywany poniżej = 2. Poniżej wyniki. Jakie są Wasze opinie na temat tego dysku? smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.1.0-3-grml-amd64] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: TOSHIBA MK3256GSY Serial Number: 60CBFC89S LU WWN Device Id: 5 000039 296c83bd0 Firmware Version: LH013C User Capacity: 320,072,933,376 bytes [320 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed Feb 27 09:32:48 2013 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x0033) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 050 Pre-fail Always - 0 2 Throughput_Performance 0x0007 100 100 050 Pre-fail Always - 0 3 Spin_Up_Time 0x0003 100 100 002 Pre-fail Always - 2179 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 1946 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 1757 10 Spin_Retry_Count 0x0013 138 100 030 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1923 183 Runtime_Bad_Block 0x0022 100 100 001 Old_age Always - 2 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0 185 Unknown_Attribute 0x0032 100 100 001 Old_age Always - 65535 187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 223 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0 189 High_Fly_Writes 0x003a 100 100 001 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 058 047 045 Old_age Always - 42 (Min/Max 41/42) 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 115 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 524296 193 Load_Cycle_Count 0x0032 095 095 000 Old_age Always - 54850 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 236 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 236 occurred at disk power-on lifetime: 1168 hours (48 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 0a ac 30 4b 40 Error: UNC at LBA = 0x004b30ac = 4927660 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 60 80 08 88 30 4b 40 00 00:13:31.860 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:31.860 SET FEATURES [Enable write cache] aa aa aa aa aa aa aa ff 00:13:31.840 [RESERVED] 60 80 08 88 30 4b 40 00 00:13:28.709 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:28.709 SET FEATURES [Enable write cache] Error 235 occurred at disk power-on lifetime: 1168 hours (48 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 0a ac 30 4b 40 Error: UNC at LBA = 0x004b30ac = 4927660 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 60 80 08 88 30 4b 40 00 00:13:28.709 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:28.709 SET FEATURES [Enable write cache] aa aa aa aa aa aa aa ff 00:13:28.690 [RESERVED] 60 80 08 88 30 4b 40 00 00:13:25.558 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:25.558 SET FEATURES [Enable write cache] Error 234 occurred at disk power-on lifetime: 1168 hours (48 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 0a ac 30 4b 40 Error: UNC at LBA = 0x004b30ac = 4927660 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 60 80 08 88 30 4b 40 00 00:13:25.558 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:25.558 SET FEATURES [Enable write cache] aa aa aa aa aa aa aa ff 00:13:25.540 [RESERVED] 60 80 08 88 30 4b 40 00 00:13:22.407 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:22.407 SET FEATURES [Enable write cache] Error 233 occurred at disk power-on lifetime: 1168 hours (48 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 0a ac 30 4b 40 Error: UNC at LBA = 0x004b30ac = 4927660 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 60 80 08 88 30 4b 40 00 00:13:22.407 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:22.407 SET FEATURES [Enable write cache] aa aa aa aa aa aa aa ff 00:13:22.390 [RESERVED] 60 80 08 88 30 4b 40 00 00:13:19.256 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:19.256 SET FEATURES [Enable write cache] Error 232 occurred at disk power-on lifetime: 1168 hours (48 days + 16 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 41 0a ac 30 4b 40 Error: UNC at LBA = 0x004b30ac = 4927660 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 60 80 08 88 30 4b 40 00 00:13:19.256 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:19.256 SET FEATURES [Enable write cache] aa aa aa aa aa aa aa ff 00:13:19.239 [RESERVED] 60 80 08 88 30 4b 40 00 00:13:16.105 READ FPDMA QUEUED ef 02 00 00 00 00 00 00 00:13:16.104 SET FEATURES [Enable write cache] SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 1750 - # 2 Extended offline Completed without error 00% 1618 - # 3 Short offline Completed without error 00% 9 - # 4 Short offline Completed without error 00% 9 - # 5 Short offline Completed without error 00% 8 - # 6 Short offline Completed without error 00% 8 - # 7 Short offline Completed without error 00% 7 - # 8 Short offline Completed without error 00% 3 - # 9 Short offline Completed without error 00% 3 - #10 Short offline Completed without error 00% 2 - #11 Short offline Completed without error 00% 2 - #12 Short offline Completed without error 00% 1 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. -- Jacek Politowski |
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Data: 2013-02-27 13:22:38 | |
Autor: Chris | |
S.M.A.R.T. - Toshiba - Reported_Uncorrect | |
Jacek Politowski nabazgrał(a):
Mam serię laptopów z dyskami Toshiby MK3256GSY. W podobnym czasie http://www.toshiba.pl/innovation/pl/generic/ASP_SUPPORT/ -- www.bezwypadkowy.net - Sprawdź historię auta i zobacz czy nie było wrakiem. www.automo.pl - Sprawdź VIN, wyposażenie, przebieg, historię wypadkową. |
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